Axial Channeling in Electron Diffraction
نویسنده
چکیده
für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namensnennung 4.0 Lizenz. Axial Channeling in Electron Diffraction
منابع مشابه
Basic Principles and Application of Electron Channeling in a Scanning Electron Microscope for Dislocation Analysis
Dislocations are extended defects within crystalline solids that often influence the mechanical, electrical, magnetic and optical properties of the material. Establishing more quantitative relationships between dislocations and material properties relies on effective microscopy or spectroscopy methods that can resolve both dislocation type and position within the solid. Diffraction has historic...
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Electron backscattered diffraction (EBSD) has replaced electron channeling and selected area electron channeling patterns (SACPs) for many scanning electron microscopy (SEM) based crystallographic studies, due to the rapid collection rates and high spatial resolution of EBSD. Nevertheless, a number of SEM techniques, for example electron channeling contrast imaging (ECCI), are better served usi...
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The measurements of electron Channeling Radiation (CR) have been performed at ELBE linear electron accelerator of the Forschungszentrum Dresden-Rossendorf. The aim of performing these experiments was to optimize radiation yield and spectral line width of CR in order to apply channeling radiation for preparing a monochromatic X-ray source. Diamond crystals can be used in relatively high electron...
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für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...
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Defect analysis using a Scanning Electron Microscope (SEM), commonly known as Electron Channeling Contrast Imaging (ECCI), has received much attention in the recent past. Traditional defect analysis has for decades relied on Transmission Electron Microscopy (TEM) modalities, such as the bright field-dark field and weak beam imaging, and Scanning Transmission Electron Microcopy (STEM) diffractio...
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